Somerville, MA, United States of America

Steven Thomas

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Lumafield, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Steven Thomas. Retrieved from https://idiyas.com/inventor/steven-thomas-gt5zvdjp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Steven Thomas and Seed Quality Analysis Using Computed Tomography.

Introduction

Steven Thomas is an inventor associated with Somerville, Massachusetts, and Lumafield, Inc. His patent work addresses the use of computed tomography to assess seed quality by analyzing seedlings in germination towels.

Latest Patents

Thomas is associated with 1 patent: “Seed Quality Analysis Using Computed Tomography.” The invention describes methods, apparatuses, computer program products, and systems for evaluating germination towels. It processes computed tomography data to identify likely seeds and candidate shoots and roots, forms and groups segments based on proximity and alignment, and assembles likely seedlings. A classifier then uses the identified seedlings to classify the germination towel and provide a result.

Career Highlights

A key highlight of Thomas’s patent work is applying computed tomography and image analysis to seed assessment. The disclosed approach combines detection, segmentation, grouping, and classification to evaluate seedlings within a germination towel.

Collaborations

Thomas is associated with Lumafield, Inc. His named coworkers include Andreas Linas Bastian and Sondre Skatter.

Conclusion

Steven Thomas’s patent describes a computational approach to seed quality analysis that uses computed tomography and classification to assess seedlings in germination towels.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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