Fairfield, OH, United States of America

Steven T Smith

This inventor holds 1 USPTO granted patent. Top assignee: Sick Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Steven T Smith. Retrieved from https://idiyas.com/inventor/steven-t-smith

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovations of Steven T. Smith

Introduction

Steven T. Smith is an accomplished inventor based in Fairfield, OH (US). He has made significant contributions to the field of inspection technology. His work focuses on enhancing the efficiency and accuracy of object detection in conveyance systems.

Latest Patents

Steven holds a patent for an "Inspection apparatus, system, and method." This invention encompasses systems, apparatuses, methods, and computer program products designed for the inspection of objects or items within a conveyance system. The technology enables the detection of the presence or absence of objects and allows for the determination of various characteristics through image detection of laser lines projected onto the conveyance surface.

Career Highlights

Steven is currently employed at Sick Inc., where he applies his expertise in developing innovative inspection solutions. His work has been instrumental in advancing the capabilities of inspection systems, making them more reliable and efficient.

Collaborations

Throughout his career, Steven has collaborated with notable colleagues, including Robert Louis Stone and Mohammed Islam. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Steven T. Smith's contributions to the field of inspection technology exemplify the impact of innovation on industry practices. His patent and work at Sick Inc. highlight his commitment to advancing technology for improved object detection and inspection processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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