Redmond, WA, United States of America

Steven T Henderson

This inventor holds 1 USPTO granted patent. Top assignee: Microsoft Technology Licensing, LLC. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Steven T Henderson. Retrieved from https://idiyas.com/inventor/steven-t-henderson

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Steven T. Henderson and Computer Activity Simulation

Introduction

Steven T. Henderson is an inventor associated with Redmond, Washington, and Microsoft Technology Licensing, LLC. His patent work addresses methods for testing computer systems by simulating activity based on projected user patterns.

Latest Patents

Henderson is listed as an inventor on 1 patent: “Stochastic Simulation of Computer Activity Based on User Categories.” The invention describes simulating computer activity by navigating a decision tree representing projected user patterns. Each pattern assigns weights to standard functions, such as phone, email, and web use. The system selects a function according to its assigned weight, then navigates a probability tree to determine which test to perform.

Career Highlights

Henderson’s documented patent contribution focuses on a structured approach to computer-system testing. By modeling different categories of user activity, the method can help generate tests that reflect varied patterns of system use.

Collaborations

The patent information also names Robert Charles Webster and Dale R. Rolf as Henderson’s coworkers.

Conclusion

Steven T. Henderson’s patent describes a probability-based method for simulating user activity and selecting computer-system tests, reflecting his documented work in software testing innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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