North Ryde, Australia

Steven Russell

This inventor holds 1 USPTO granted patent. Top assignee: Sandvik Rock Processing Australia Pty Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Steven Russell. Retrieved from https://idiyas.com/inventor/steven-russell-3mm374b6

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Steven Russell: Inventor in Ore-Treatment Wear Scanning

Introduction

Steven Russell is an inventor based in North Ryde, Australia. His listed patent is associated with Sandvik Rock Processing Australia Pty Limited and concerns scanning wear on treatment decks used in vibratory processing equipment.

Latest Patents

Russell is named on one patent: “Wear Scanning of Screening and Other Ore Treatment Decks.” The invention describes a mobile scanning device that travels along a treatment deck and scans the surfaces of its treatment panel modules. It gathers information about wear and transmits that information to remote control equipment outside the deck. The approach is intended to help monitor wear conditions in ore-treatment equipment.

Career Highlights

The available information identifies Russell’s work through this patent and his association with Sandvik Rock Processing Australia Pty Limited. The patent focuses on mobile scanning technology for assessing wear in screening and other ore-treatment applications.

Collaborations

The listed coworkers associated with Russell are Asad Mammadov and Morgan Vine. The provided information does not specify their individual roles in the patent or their contributions to the invention.

Conclusion

Steven Russell’s listed invention applies mobile scanning and remote data transmission to monitoring wear on ore-treatment decks, with the aim of supporting assessment of treatment panel conditions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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