This inventor holds 1 USPTO granted patent. Top assignee: Inex/vistech Technologies, Inc.. Active years: 1990.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1990
Title: The Innovative Mind of Steven R. Rowley
Introduction
Steven R. Rowley is an accomplished inventor based in West Palm Beach, FL. He has made significant contributions to the field of container inspection technology. With a focus on efficiency and accuracy, Rowley's work has the potential to enhance operational processes in various industries.
Latest Patents
Rowley holds a patent for a "Comprehensive Container Inspection System." This innovative system includes axial container examining features, side wall inspection features, and a controllable diverter for routing containers to one of at least two sorting paths. Each stage of the inspection system is designed to process moving containers continuously, allowing for efficient operation without stoppages. The axial inspection area utilizes side rollers to carry containers through various inspection stages, while the side wall inspection area employs a video detector to analyze images of the rolling containers.
Career Highlights
Rowley is currently associated with Inex/Vistech Technologies, Inc., where he applies his expertise in developing advanced inspection systems. His work has been instrumental in improving the reliability and speed of container inspections, which is crucial for industries that rely on high-volume processing.
Collaborations
Rowley has collaborated with notable colleagues, including Donald Darling and Tyce Fitzmorris. Their combined efforts have contributed to the advancement of technologies that streamline container inspection processes.
Conclusion
Steven R. Rowley's innovative contributions to container inspection technology exemplify the impact of dedicated inventors in enhancing operational efficiency. His patent and ongoing work continue to shape the future of inspection systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile