La Jolla, CA, United States of America

Steven Peltier

This inventor holds 1 USPTO granted patent. Top assignee: University of California. Active years: 2024.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: The Innovations of Steven Peltier

Introduction

Steven Peltier is an accomplished inventor based in La Jolla, California. He has made significant contributions to the field of electron microscopy through his innovative work on epoxy resins. His research focuses on developing materials that enhance the performance and reliability of electron microscopy applications.

Latest Patents

Steven Peltier holds a patent for "Charge-resistant epoxy resins for electron microscopy applications." This invention involves an epoxy resin-based embedding media that is doped with a non-conductive dopant to achieve a predetermined weight/weight percentage. The media is designed to be non-charging at 1.8 keV. A preferred dopant is polyethylene glycol with a molecular weight of at least 3350, with a predetermined weight/weight percentage ranging from 2% to 10%. Another preferred dopant is polyethylene glycol with a molecular weight of 7000-8000, with a predetermined weight/weight percentage of up to approximately 30%.

Career Highlights

Steven Peltier is affiliated with the University of California, where he continues to advance his research in materials science. His work has garnered attention for its practical applications in enhancing electron microscopy techniques.

Collaborations

Throughout his career, Steven has collaborated with notable colleagues, including Thomas Deerinck and Mark H. Ellisman. These partnerships have contributed to the development of innovative solutions in the field of microscopy.

Conclusion

Steven Peltier's contributions to the field of electron microscopy through his patented innovations demonstrate his commitment to advancing scientific research. His work continues to impact the way materials are utilized in microscopy applications.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
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