This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Brigham Young University. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Steven Paul Allen: MRI Thermometry Innovation
Introduction
Steven Paul Allen is an inventor associated with Springville, Utah, and Brigham Young University. His patent work addresses MRI thermometry, a technique for obtaining temperature information from magnetic resonance imaging data.
Latest Patents
The provided information lists one patent for Allen: “Multiple Orthogonal Slice Processing and Separation to Obtain Temperature Information for MRI Thermometry.” The invention describes a method for processing MRI images to determine treatment-related temperature information across multiple orthogonal slices.
The method decomposes baseline images for each slice into image features, then acquires a combined, multi-encoded treatment image using an MRI scanner. It subtracts a weighted sum of the baseline features from that image to isolate treatment-specific temperature information. Further processing separates the combined information into slice-specific temperature data. This approach is intended to help assess temperature changes associated with treatment or thermal ablation.
Career Highlights
Allen’s listed patent connects his inventive work with Brigham Young University. The invention focuses on processing MRI data to distinguish treatment-related temperature changes from baseline image features.
Collaborations
Matthew David Osburn is identified as Allen’s coworker. The provided information does not specify their roles in the patent or describe the nature of their collaboration.
Conclusion
Steven Paul Allen’s listed invention applies multi-slice image processing to MRI thermometry, aiming to produce treatment-specific temperature information that can support analysis of thermal procedures.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
