Tampa, FL, United States of America

Steven Mandel

This inventor holds 2 USPTO granted patents. Top assignees: Hyland Software Inc., Microsystems Technology, Inc.. Active years: 2012-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Steven Mandel. Retrieved from https://idiyas.com/inventor/steven-mandel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.5

ph-index = 2

Forward Citations = 42(Granted Patents)


Company Filing History:


Years Active: 2012-2013

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2 patents (USPTO):Explore Patents

Title: Steven Mandel: Innovator in Check Detection Technology

Introduction

Steven Mandel is a notable inventor based in Tampa, FL (US), recognized for his contributions to check detection technology. He holds 2 patents that showcase his innovative approach to improving document image processing.

Latest Patents

Mandel's latest patents include "Check boundary detection by string literal analysis" and "Automated check detection and image cropping." The first patent describes a method for locating a check image region within a document image by identifying a magnetic ink character recognition (MICR) region and calculating the top of the check based on string literals that relate to the upper boundary. The second patent outlines a similar method for detecting check images and cropping them accurately by referencing the MICR region.

Career Highlights

Throughout his career, Steven Mandel has worked with several companies, including Microsystems Technology, Inc. and Hyland Software Inc. His experience in these organizations has contributed to his expertise in the field of document imaging and check processing.

Collaborations

Mandel has collaborated with notable individuals such as Charles W. Jackson and Robert Scott Moriarty, enhancing his work through shared knowledge and expertise.

Conclusion

Steven Mandel's innovative patents and career achievements highlight his significant contributions to the field of check detection technology. His work continues to influence advancements in document imaging.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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