Company Filing History:
Years Active: 1987
Title: The Innovative Mind of Steven M. DeFoster
Introduction
Steven M. DeFoster, an inventive spirit based in Binghamton, NY, has made significant contributions to the field of circuit measurement technology. With a unique talent for innovation and problem-solving, he has dedicated his career to advancing methods used in the detection of wiring defects in printed circuits.
Latest Patents
DeFoster holds a patent for a groundbreaking invention titled "System for Measuring and Detecting Printed Circuit Wiring Defects." This non-contact system offers a sophisticated approach for identifying defects and measuring the height of circuit features relative to their substrate. The system utilizes an energy source to illuminate the substrate and circuit features, while a scanner captures the energy reflected from these components. This reflection data is transformed into a signal that varies with the intensity of the reflected energy, enabling precise measurements. The analyzer connected to this scanner correlates the signals to provide an accurate representation of the circuit features' height, accommodating variations in the substrate surface due to bending or warpage.
Career Highlights
Steven M. DeFoster is affiliated with the prestigious International Business Machines Corporation (IBM), where he has contributed to various projects that enhance the performance and reliability of electronic materials. His innovative solutions have not only met industry standards but have also paved the way for advancements in circuit technology.
Collaborations
Throughout his career, DeFoster has worked alongside esteemed colleagues such as Robert M. Crabb and Norman E. Rittenhouse. Their collaborations have fostered a productive environment that encourages the merging of ideas and expertise, further enhancing the quality of innovations produced.
Conclusion
In summary, Steven M. DeFoster exemplifies the innovative spirit that drives technological progress in the realm of printed circuit technologies. His patent for a system designed to detect wiring defects reflects his commitment to quality and precision. As he continues his work at IBM, the world can anticipate further developments that will shape the future of circuit design and measurement.