This inventor holds 1 USPTO granted patent and 2 published patent applications and 1 EPO patent. Top assignee: Other. Active years: 2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2022
Title: Steven Donald Wardell: Innovator in Manufacturing Inspection Technology
Introduction
Steven Donald Wardell is a notable inventor based in Cambridge, CA. He has made significant contributions to the field of manufacturing through his innovative patent. His work focuses on enhancing the inspection processes within manufacturing environments, ensuring quality and efficiency.
Latest Patents
Wardell holds a patent for a "System and method for combined automatic and manual inspection." This method involves acquiring images of parts in a manufacturing setting, enhancing those images, and automatically analyzing them for potential defects. If a defect is detected, the system displays the image to an operator for further evaluation. The operator can then provide input on the part's status, which is stored alongside the image. This process includes a confidence level in the automatic analysis, ensuring that only images that do not meet a certain threshold are shown to the operator. Wardell's patent represents a significant advancement in manufacturing inspection technology, with 1 patent to his name.
Career Highlights
Throughout his career, Wardell has focused on improving manufacturing processes through innovative technologies. His work has been instrumental in developing systems that enhance the accuracy and reliability of inspections, ultimately leading to better product quality.
Collaborations
Wardell has collaborated with various professionals in the field, including his coworker, Daniel Blair De Verteuil. Their combined expertise has contributed to the development of effective inspection methods that benefit the manufacturing industry.
Conclusion
Steven Donald Wardell is a key figure in the realm of manufacturing inspection technology. His innovative patent showcases his commitment to improving quality control processes in manufacturing environments. His contributions continue to influence the industry positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile