Steven Danyluk

Title: Steven Danyluk: Innovator in Stress Measurement Technology

Introduction

Steven Danyluk is a prominent inventor based in Atlanta, GA (US). He has made significant contributions to the field of stress measurement technology, holding a total of 9 patents. His work focuses on innovative methods and tools that enhance the understanding of residual stresses in materials.

Latest Patents

One of Danyluk's latest patents is the Polariscope stress measurement tool and method of use. This invention provides a tool and method utilizing an infrared transmission technique to extract the full stress components of in-plane residual stresses in thin, multi-crystalline silicon wafers. It includes in situ measurement of residual stress for large cast wafers. The shear difference method is employed to obtain full stress components by integrating the shear stress map from the boundaries. System ambiguity at the boundaries is resolved by introducing a new analytical function. Additionally, a new anisotropic stress optic law is provided, with stress optic coefficients calibrated for different crystal grain orientations and stress orientations.

Career Highlights

Danyluk has worked with notable organizations such as Georgia Tech Research Corporation and the University of Chicago. His experience in these institutions has allowed him to develop and refine his innovative approaches to stress measurement.

Collaborations

Some of his notable coworkers include Anatoly Zharin and Elmer Zanoria. Their collaboration has contributed to the advancement of research in the field of stress measurement.

Conclusion

Steven Danyluk is a key figure in the development of advanced stress measurement technologies. His inventions, particularly the Polariscope stress measurement tool, demonstrate his commitment to innovation and excellence in engineering.