Oak Ridge, TN, United States of America

Steven D Pain

This inventor holds 1 USPTO granted patent. Top assignee: Ut-Battelle, Inc.. Active years: 2019.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Innovations of Steven D Pain in Directional-Neutron Detection

Introduction

Steven D Pain is an accomplished inventor based in Oak Ridge, TN (US). He has made significant contributions to the field of neutron detection technology. His innovative work has led to the development of a unique apparatus that enhances the capabilities of directional-neutron detectors.

Latest Patents

Steven D Pain holds a patent for an "Apparatus for use in a directional-neutron detector, directional-neutron detectors and methods of use thereof." This apparatus features a structure with a plurality of parallel active channels separated by inactive regions. The active channels are filled with scintillating material that emits light in response to neutron scattering. This material is designed to discriminate between neutrons and gamma rays, providing enhanced detection capabilities. The scintillating material is sealed within the active channels, ensuring its effectiveness in various applications.

Career Highlights

Steven D Pain is associated with Ut-Battelle, Inc., where he has been instrumental in advancing neutron detection technologies. His work has not only contributed to scientific research but also has practical applications in various fields, including nuclear safety and security.

Collaborations

Steven has collaborated with notable colleagues such as Michael T Febbraro and William A Peters. These partnerships have fostered innovation and have been crucial in the development of advanced detection systems.

Conclusion

Steven D Pain's contributions to directional-neutron detection exemplify the impact of innovative thinking in technology. His patent and collaborative efforts continue to influence the field positively.

Profile summary based on public USPTO records.
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