Atkinson, NH, United States of America

Steven Boyle

This inventor holds 1 USPTO granted patent. Top assignee: Analog Devices,inc.. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Steven Boyle. Retrieved from https://idiyas.com/inventor/steven-boyle

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Steven Boyle - Innovator in Monitoring Circuit Technology

Introduction

Steven Boyle is a notable inventor based in Atkinson, NH (US). He has made significant contributions to the field of measuring apparatuses, particularly with his innovative patent that includes a self-test function. His work is instrumental in enhancing the reliability and accuracy of monitoring circuits.

Latest Patents

Steven Boyle holds a patent for a "Monitoring circuit having a self-test function." This invention features a measuring apparatus that includes a capacitor, multiple switches, a test signal injector, and at least one comparator. The self-test function is designed to ensure the circuit operates correctly by simulating out-of-range voltage conditions and monitoring the output of the comparator.

Career Highlights

Steven Boyle is currently employed at Analog Devices, Inc., where he applies his expertise in circuit design and innovation. His work focuses on developing advanced technologies that improve measurement accuracy and reliability in various applications.

Collaborations

Steven has collaborated with talented coworkers, including Colin Charles Price and Asif Ahmad. Their combined efforts contribute to the innovative environment at Analog Devices, Inc., fostering advancements in technology.

Conclusion

Steven Boyle's contributions to monitoring circuit technology exemplify the impact of innovation in engineering. His patent reflects a commitment to enhancing measurement systems, showcasing the importance of self-test functions in ensuring device reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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