Location History:
- Boeykens, BE (2017)
- Heverlee, BE (2017)
Company Filing History:
Years Active: 2017
Title: Innovations by Steven Boeykens
Introduction
Steven Boeykens is a notable inventor based in Boeykens, Belgium. He has made significant contributions to the field of semiconductor technology, holding a total of 2 patents. His work focuses on advanced inspection methods for transparent and semitransparent objects, particularly in the semiconductor industry.
Latest Patents
One of his latest patents is titled "Object carrier, system and method for back light inspection." This invention discloses a carrier with a base layer that possesses photo luminescent properties. It is designed to carry transparent or semitransparent objects, such as wafers, for inspection purposes. The system includes a light source positioned above the carrier, directing excitation light through the object to enhance inspection accuracy.
Another significant patent is the "Method and apparatus for inspection of light emitting semiconductor devices using photoluminescence imaging." This method involves illuminating a light emitting semiconductor device with a specific waveband of light to generate electron-hole pairs. The emitted light is then captured by a sensitive camera sensor, and the data is processed by a computer system to derive inspection results.
Career Highlights
Steven Boeykens is currently employed at Kla Tencor Corporation, a leading company in the field of semiconductor inspection and metrology. His innovative work has contributed to the advancement of technologies that enhance the efficiency and accuracy of semiconductor device inspections.
Collaborations
Throughout his career, Steven has collaborated with talented professionals, including Tom Marivoet and Christophe Wouters. These collaborations have fostered a creative environment that promotes innovation and technological advancement.
Conclusion
Steven Boeykens is a distinguished inventor whose contributions to semiconductor technology have led to significant advancements in inspection methods. His patents reflect a commitment to innovation and excellence in the field.