Noblesville, IN, United States of America

Steven Adam Kibler

This inventor holds 1 USPTO granted patent. Top assignee: Beckman Coulter, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Steven Adam Kibler. Retrieved from https://idiyas.com/inventor/steven-adam-kibler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Steven Adam Kibler and Density-Gradient Replication

Introduction

Steven Adam Kibler is an inventor based in Noblesville, Indiana, and is associated with Beckman Coulter, Inc. His work includes a patented system for measuring and replicating density gradients.

Latest Patents

Kibler is credited with 1 patent: “Non-destructive measurement, dispense, and replication of density gradients.” The invention measures a density gradient at points along its length and uses those measurements to generate a profile. Based on that profile, the system replicates the gradient in a second container by pumping separate components through a manifold and mixing chamber connected to a probe.

Career Highlights

The patent describes an automated approach to measuring and dispensing density gradients without destructively sampling the original gradient. The system is designed to reproduce the gradient in another container using the generated profile.

Collaborations

Kibler’s listed coworkers include Larry Wayne McIntyre and Matthew Aaron Halsmer. The patent information provided does not specify their roles in the invention.

Conclusion

Steven Adam Kibler’s patent focuses on automating the non-destructive measurement and replication of density gradients, reflecting his association with Beckman Coulter’s technical work.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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