Cramlington, United Kingdom

Steve Lowry

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Copper State Bolt & Nut Company, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Steve Lowry. Retrieved from https://idiyas.com/inventor/steve-lowry

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Steve Lowry - Innovator in Tension Monitoring Technology

Introduction

Steve Lowry is an inventor based in Cramlington, GB. He is currently associated with Copper State Bolt & Nut Company, Inc. Although he does not hold any granted patents, he has made significant contributions to the field of tension monitoring technology.

Latest Patent Applications

One of Steve Lowry's notable patent applications is for a Tension Monitoring Apparatus. This apparatus comprises a fixing with a shank that is under tension during use. It includes a strain sensor embedded in the shank, which generates a strain sensor signal corresponding to the tension in the shank. The apparatus is equipped with data processing means that receive and process the strain sensor signal according to various characterizing parameters. This processing generates strain sensor data indicative of the strain experienced by the shank. Additionally, the apparatus features a wireless transmitter that communicates the strain sensor data to a remote receiver. The data processing means and the wireless transmitter are mounted in a module fixed to the end of the fixing.

Conclusion

Steve Lowry's work in developing innovative tension monitoring technology showcases his commitment to advancing engineering solutions. His contributions, although not yet reflected in granted patents, highlight the potential for future advancements in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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