Colorado Springs, CO, United States of America

Steve Cruz


Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Steve Cruz - Innovator in Machine Learning for Image Forgery Localization

Introduction

Steve Cruz is an accomplished inventor based in Colorado Springs, CO (US). He has made significant contributions to the field of machine learning, particularly in the area of image forgery detection. His innovative approach has led to the development of a unique system that enhances the localization of image forgery.

Latest Patents

Cruz holds a patent for "Machine learning systems and methods for improved localization of image forgery." This system generates a variational information bottleneck objective function and works with input image patches to implement an encoder-decoder architecture. The encoder-decoder architecture controls the information flow between the input image patches and a representation layer. The system utilizes information bottleneck techniques to learn useful residual noise patterns while ignoring the semantic content present in each input image patch. It trains a neural network to learn a representation indicative of a statistical fingerprint of a source camera model from each input image patch, excluding the semantic content. The trained neural network can determine a splicing manipulation localization effectively.

Career Highlights

Throughout his career, Cruz has worked with notable organizations, including Insurance Services Office, Inc. and the University of Colorado. His experience in these institutions has allowed him to refine his skills and contribute to advancements in technology.

Collaborations

Cruz has collaborated with esteemed colleagues such as Aurobrata Ghosh and Terrance Edward Boult. Their combined expertise has furthered research and development in the field of machine learning and image processing.

Conclusion

Steve Cruz is a pioneering inventor whose work in machine learning systems has made a significant impact on the localization of image forgery. His innovative patent and collaborations highlight his dedication to advancing technology in this critical area.

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