Marlborough, MA, United States of America

Stephen T Yarnell

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Faxitron Bioptics, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stephen T Yarnell. Retrieved from https://idiyas.com/inventor/stephen-t-yarnell

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Stephen T. Yarnell and Probe-Guided Surgical Localization.

Introduction

Stephen T. Yarnell is an inventor associated with Marlborough, Massachusetts, and Faxitron Bioptics, LLC. His patent work addresses tools for identifying target areas during probe-guided radio-localization surgery.

Latest Patents

Yarnell is named on 1 patent: “Gamma Probe with Hand-Piece Control of Detection Parameters.” The invention describes a probe with a hand-piece controller that lets users switch between nuclear-uptake detection modes. For example, a user can select high-sensitivity or high-resolution mode to better match the probe’s detection settings to the search task and help distinguish a target area from interfering nuclear signals.

Career Highlights

The patent reflects work on integrating detection controls directly into a surgical probe, enabling users to adjust operating modes at the hand-piece during a procedure. Yarnell is associated with Faxitron Bioptics, LLC.

Collaborations

The available information identifies Faxitron Bioptics, LLC, as Yarnell’s company affiliation. It does not specify additional collaborators or co-inventors.

Conclusion

Stephen T. Yarnell’s patent focuses on making probe-guided surgical localization more adaptable by allowing direct control of nuclear-detection modes from the probe hand-piece.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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