Bucks, United Kingdom

Stephen Richard Blight

This inventor holds 1 USPTO granted patent. Top assignees: Bio-Rad Microscience Limited, University of Sheffield. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stephen Richard Blight. Retrieved from https://idiyas.com/inventor/stephen-richard-blight

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: The Innovations of Stephen Richard Blight

Introduction

Stephen Richard Blight is a notable inventor based in Bucks, GB. He has made significant contributions to the field of semiconductor materials. His work has been recognized through the granting of a patent, showcasing his innovative approach to technology.

Latest Patents

Stephen holds a patent for a "Method and apparatus for mapping of semiconductor materials." This invention reflects his expertise and dedication to advancing semiconductor technology. He has been awarded 1 patent for his innovative work.

Career Highlights

Throughout his career, Stephen has worked with esteemed organizations such as The University of Sheffield and Bio-Rad Microscience Limited. His experiences in these institutions have allowed him to develop and refine his skills in the field of semiconductor research.

Collaborations

Stephen has collaborated with notable individuals in his field, including John Roberts and Ian Leslie Freeston. These partnerships have contributed to the advancement of his research and innovations.

Conclusion

Stephen Richard Blight's contributions to semiconductor technology through his patent and collaborations highlight his role as an influential inventor. His work continues to inspire advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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