This inventor holds 3 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 1992-1993.
Company Filing History:
Years Active: 1992-1993
Title: The Innovations of Stephen J Kish
Introduction
Stephen J Kish is an accomplished inventor based in Hyde Park, NY (US). He has made significant contributions to the field of object inspection technology. With a total of 3 patents to his name, Kish has developed innovative methods that enhance the accuracy and efficiency of defect detection.
Latest Patents
Kish's latest patents include a method and apparatus for object inspection. This invention teaches a method for inspecting and handling surface level defects. The process involves positioning the object to be inspected and using polarized laser light reflected off a rotated polygon mirror. This technique allows the light to move over the area of interest. A plurality of fiber optic bundles is utilized to receive and conduct the reflected light back to photomultipliers. These photomultipliers convert the light into electrical signals, which are then digitized by associated electronics. By tracking pixel edge boundaries and determining if certain thresholds are exceeded, the area can be checked for various defects. The defects can then be categorized by comparing them to a reference base.
Another notable patent is the Advanced via inspection tool (AVIT), which shares similar principles with his previous invention. This method also focuses on the inspection and handling of surface level defects, employing the same laser light and fiber optic technology to ensure precise defect detection.
Career Highlights
Stephen J Kish is currently employed at International Business Machines Corporation (IBM). His work at IBM has allowed him to further develop his innovative ideas and contribute to advancements in technology.
Collaborations
Kish has collaborated with notable coworkers such as Julius J Lambright and Douglas Y Kim. Their combined expertise has likely contributed to the success of Kish's inventions.
Conclusion
Stephen J Kish's contributions to object inspection technology demonstrate his innovative spirit and dedication to improving defect detection methods. His patents reflect a commitment to advancing technology in meaningful ways.