This inventor holds 1 USPTO granted patent. Top assignees: Texas Instruments Corporation, Texas Tech University System. Active years: 1997.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:


Years Active: 1997
Title: The Innovations of Stephen J Demoor
Introduction
Stephen J Demoor is an accomplished inventor based in Sugarland, TX (US). He has made significant contributions to the field of technology, particularly in the area of semiconductor fabrication. His innovative approach has led to the development of a unique method for aligning and measuring misregistration in silicon wafers.
Latest Patents
Stephen J Demoor holds a patent for an "Apparatus and method for aligning and measuring misregistration." This patent describes a method for aligning a silicon wafer in a fabrication tool. The process involves producing a digital image of a portion of the wafer, converting the image to image primitives, and comparing these primitives to grammar template primitives to locate a known intersection on the wafer. The method also includes steps for determining the misregistration of two layers of a wafer by converting targets to primitives and assessing their relative displacement in symbolic space. The apparatus comprises a camera, a video-to-digital converter, a computer, and a stage adjuster. He has 1 patent to his name.
Career Highlights
Throughout his career, Stephen has worked with notable organizations, including Texas Instruments Corporation and Texas Tech University System. His experience in these companies has allowed him to refine his skills and contribute to various technological advancements.
Collaborations
Stephen has collaborated with talented individuals such as A Kathleen Hennessey and YouLing Lin. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.
Conclusion
Stephen J Demoor's contributions to the field of semiconductor technology are noteworthy. His innovative methods for aligning and measuring misregistration in silicon wafers demonstrate his expertise and commitment to advancing technology. His work continues to influence the industry and inspire future innovations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile