Madison, NJ, United States of America

Stephen G Maeske

This inventor holds 1 USPTO granted patent. Top assignee: Verizon Patent and Licensing Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stephen G Maeske. Retrieved from https://idiyas.com/inventor/stephen-g-maeske

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Stephen G. Maeske and Network Anomaly Detection

Introduction

Stephen G. Maeske is an inventor associated with Madison, New Jersey, and Verizon Patent and Licensing Inc. His patent work includes a system for detecting anomalies in network elements by analyzing test-case data.

Latest Patents

Maeske is named on 1 patent, titled “Systems and Methods for Anomaly Detection Using Test Case Signatures.” The invention describes a device that receives network packets generated from a test case and uses a generative artificial intelligence model to create signatures summarizing those packets in the context of the test. It groups the signatures by protocol, analyzes each protocol-specific group independently to identify anomalies, and combines the analysis results to determine an overall test-case outcome. The device can then take actions based on that outcome.

Career Highlights

Maeske’s listed patent is associated with Verizon Patent and Licensing Inc. It addresses the use of artificial intelligence and protocol-specific analysis to support network testing and anomaly detection.

Collaborations

Mourad B. Takla and Manish Kolhe are identified as Maeske’s coworkers. The available information does not specify whether they collaborated with him on this patent.

Conclusion

Stephen G. Maeske’s patent highlights an approach to network testing that combines generative AI, test-case signatures, and protocol-based analysis to detect anomalies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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