Palmyra, NJ, United States of America

Stephen B Duff

This inventor holds 1 USPTO granted patent. Top assignee: Moore Products Co.. Active years: 1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stephen B Duff. Retrieved from https://idiyas.com/inventor/stephen-b-duff

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: The Innovations of Stephen B Duff

Introduction

Stephen B Duff is an accomplished inventor based in Palmyra, NJ (US). He has made significant contributions to the field of process control systems. His innovative approach has led to the development of a unique patent that enhances the functionality of Sequential Function Charts (SFC).

Latest Patents

Stephen holds a patent for a "Monitoring and control system and method." This invention provides a program-controlled apparatus that allows operators to control the mode of an SFC. The system offers five different modes: OFF mode, AUTO mode, HOLD mode, MANUAL mode, and TRACE mode. Each mode serves a specific purpose, enhancing the convenience of monitoring, editing, and changing the SFC program.

Career Highlights

Stephen is currently employed at Moore Products Co., where he applies his expertise in process control systems. His work has been instrumental in advancing the capabilities of the company's offerings. With a focus on innovation, he continues to push the boundaries of technology in his field.

Collaborations

Stephen collaborates with Jack S Paltenstein, leveraging their combined knowledge and skills to drive innovation within their projects.

Conclusion

Stephen B Duff's contributions to the field of process control systems exemplify the spirit of innovation. His patent and work at Moore Products Co. highlight his commitment to enhancing technology for better operational efficiency.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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