Stephanie Carys Shum

Title: Stephanie Carys Shum: Innovator in Problem Fix Verification

Introduction

Stephanie Carys Shum is a notable inventor based in Wappingers Falls, NY (US). She has made significant contributions to the field of computing through her innovative patent. Her work focuses on enhancing the efficiency of problem fix verification procedures, which is crucial for maintaining the integrity of computing systems.

Latest Patents

Stephanie holds a patent titled "Problem fix verification generation." This patent describes methods and apparatus for generating problem fix verification procedures for varying corrections to defects. The method involves obtaining problem analysis data associated with a defect in a first computing system. A first representational vector corresponding to this data is generated. Additionally, second representational vectors related to historical defects in one or more second computing systems are obtained. The process determines a set of historical problem fix verification procedures based on these vectors. Ultimately, a recommended set of procedures is provided to verify corrections to the defect in the first computing system. This innovative approach aims to streamline the verification process and improve system reliability.

Career Highlights

Stephanie is currently employed at International Business Machines Corporation (IBM), where she continues to develop her expertise in computing technologies. Her work at IBM allows her to collaborate with other talented professionals in the field, further enhancing her contributions to innovation.

Collaborations

One of her notable coworkers is Patrick J Clas, with whom she collaborates on various projects within IBM. Their teamwork exemplifies the spirit of innovation and problem-solving that drives the company forward.

Conclusion

Stephanie Carys Shum is a pioneering inventor whose work in problem fix verification generation is making a significant impact in the computing industry. Her contributions not only enhance the efficiency of defect corrections but also demonstrate the importance of innovation in technology.