Paris, France

Stephane Vannuffelen

This inventor holds 1 USPTO granted patent. Top assignee: Actaris S.a.s.. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stephane Vannuffelen. Retrieved from https://idiyas.com/inventor/stephane-vannuffelen-n5bznrpo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Innovations of Stephane Vannuffelen

Introduction

Stephane Vannuffelen is an accomplished inventor based in Paris, France. He has made significant contributions to the field of fluid dynamics through his innovative patent. His work focuses on the measurement of oscillation frequencies in fluidic oscillators, showcasing his expertise in engineering and technology.

Latest Patents

Vannuffelen holds a patent for a method that measures the oscillation frequency of a fluid jet in a fluidic oscillator. This method utilizes a temperature sensor, where the resistance of the sensor varies with the oscillation frequency of the jet. The process involves feeding the temperature sensor with an AC voltage and determining the frequency components around the frequency 3×f in the output signal. This innovative approach allows for accurate measurement of the oscillation frequency, enhancing the functionality of fluidic oscillators.

Career Highlights

Stephane Vannuffelen is associated with Actaris S.a.s., where he applies his knowledge and skills to advance technology in fluid dynamics. His work at the company reflects his commitment to innovation and excellence in engineering.

Conclusion

Stephane Vannuffelen's contributions to the field of fluid dynamics through his patent demonstrate his innovative spirit and technical expertise. His work continues to influence advancements in fluidic technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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