This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Chauvin Arnoux. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Stéphane Dudognon: Innovator in Electrical Measurement Technology
Introduction
Stéphane Dudognon is a notable inventor based in Asnieres-Sur-Seine, France. He has made significant contributions to the field of electrical measurement technology, particularly with his innovative designs that enhance the accuracy and efficiency of measuring electrical currents.
Latest Patents
Dudognon holds a patent for a "Clamp for measuring AC and DC leakage currents." This invention features a measurement clamp that includes a fixed jaw and a moving jaw. The fixed jaw is equipped with a first magnetic core entirely surrounded by a first magnetic shield, while the moving jaw contains a second magnetic core surrounded by a second magnetic shield. The design incorporates two diametrically opposite air gaps that house magnetic flux sensors, and an external flux-cancellation coil can surround one or both of the magnetic shields. This innovative clamp is essential for precise measurements in various electrical applications.
Career Highlights
Stéphane Dudognon is currently employed at Chauvin Arnoux, a company renowned for its expertise in electrical measurement instruments. His work at this organization has allowed him to develop and refine his inventions, contributing to advancements in the industry.
Collaborations
Dudognon collaborates with talented professionals in his field, including Benoît Pillias and Francisque Pion. These partnerships foster an environment of innovation and creativity, leading to the development of cutting-edge technologies.
Conclusion
Stéphane Dudognon is a distinguished inventor whose work in electrical measurement technology has made a significant impact. His innovative clamp for measuring AC and DC leakage currents exemplifies his commitment to enhancing measurement accuracy. His contributions continue to influence the industry positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
