Neustadt an der Orla, Germany

Stephan Jirak

This inventor holds 1 USPTO granted patent. Top assignee: Docter Optics Se. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stephan Jirak. Retrieved from https://idiyas.com/inventor/stephan-jirak

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2025

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovations of Stephan Jirak

Introduction

Stephan Jirak is a notable inventor based in Neustadt an der Orla, Germany. He has made significant contributions to the field of optics, particularly in the production of optical elements. His work focuses on enhancing the quality and efficiency of manufacturing processes for various optical applications.

Latest Patents

Stephan Jirak holds a patent for a "Method for producing an optical element from glass." This innovative method aims to achieve high contour accuracy and surface quality for optical elements, such as lenses and headlight lenses. Additionally, it seeks to reduce production costs for objective lenses, microprojectors, and vehicle headlights.

Career Highlights

Jirak is associated with Docter Optics SE, a company known for its expertise in optical manufacturing. His role at the company has allowed him to apply his inventive skills to real-world applications, contributing to advancements in optical technology.

Collaborations

Stephan collaborates with talented individuals such as Alexander Kuppe and Ralf Polle. Their combined efforts in the field of optics have led to innovative solutions and improvements in optical element production.

Conclusion

Stephan Jirak's contributions to optical technology through his patent and work at Docter Optics SE highlight his importance as an inventor in the field. His innovative methods are paving the way for advancements in optical manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…