Munich, Germany

Stephan Apetauer

This inventor holds 1 USPTO granted patent and 2 EPO patents. Top assignee: Smiths Heimann Gmbh. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stephan Apetauer. Retrieved from https://idiyas.com/inventor/stephan-apetauer-2jztaki5

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: The Innovations of Stephan Apetauer

Introduction

Stephan Apetauer is a notable inventor based in Munich, Germany. He is recognized for his contributions to the field of technology, particularly in the development of advanced scanning systems. His innovative work has led to the creation of a significant patent that showcases his expertise and creativity.

Latest Patents

Stephan holds a patent for an X-ray scanner, which represents a breakthrough in imaging technology. This invention has the potential to enhance diagnostic capabilities in various medical and industrial applications. The patent highlights his commitment to improving technology through innovative solutions.

Career Highlights

Throughout his career, Stephan has worked with prominent companies such as Smiths Heimann GmbH and BSH Hausgeräte GmbH. His experience in these organizations has allowed him to refine his skills and contribute to significant projects in the field of technology. His work has been instrumental in advancing the capabilities of scanning systems.

Collaborations

Stephan has collaborated with talented individuals in his field, including coworkers Tobias Heilmann and Andreas Hackbarth. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Stephan Apetauer's contributions to technology, particularly through his patent for an X-ray scanner, demonstrate his innovative spirit and dedication to advancing the field. His career and collaborations reflect a commitment to excellence in invention and development.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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