Darmstadt, Germany

Steffen Sanwald

This inventor holds 1 USPTO granted patent. Top assignee: Aumovio Germany Gmbh. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Steffen Sanwald. Retrieved from https://idiyas.com/inventor/steffen-sanwald

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Steffen Sanwald and Secure-Boot Anomaly Detection.

Introduction

Steffen Sanwald is an inventor associated with Darmstadt, Germany. His patent work addresses the security of software-controlled devices during startup, focusing on detecting signs of manipulation in secure boot processes.

Latest Patents

Sanwald is associated with 1 patent: “Method for Detecting Anomalies Suggesting a Manipulation During a Secure Starting Operation of a Software-Controlled Device.” The method checks operating parameters of system components needed by a microprocessor, detects flags indicating an improperly completed boot, and verifies the authenticity of software through signatures. For multistage boot processes, it compares stage-specific counter values with reference values. Signals from these checks can help identify the type of attack and support the selection of appropriate countermeasures.

Career Highlights

Sanwald is associated with Aumovio Germany GmbH. His patent reflects work on identifying potential tampering during device startup and providing information that can help guide security responses.

Collaborations

Marc Sebastian Patric Stöttinger is identified as Sanwald’s coworker. The available information does not specify their particular projects or contributions together.

Conclusion

Steffen Sanwald’s patent focuses on detecting manipulation during secure boot by combining system checks, boot-status indicators, software-signature verification, and stage-specific counter comparisons.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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