Baldham, Germany

Stefan Wallner

This inventor holds 2 USPTO granted patents. Top assignee: Robert Bosch. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stefan Wallner. Retrieved from https://idiyas.com/inventor/stefan-wallner-cpivdq9y

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2021

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2 patents (USPTO):Explore Patents

Title: Innovations of Stefan Wallner

Introduction

Stefan Wallner is a notable inventor based in Baldham, Germany. He has made significant contributions to the field of camera technology, particularly in applications for building exteriors. With a total of 2 patents to his name, Wallner continues to push the boundaries of innovation.

Latest Patents

Among his latest patents is a camera device designed for the exterior region of a building. This camera system enhances security and monitoring capabilities for various architectural structures. His work in this area demonstrates a commitment to improving safety through advanced technology.

Career Highlights

Stefan Wallner is currently employed at Robert Bosch, a leading global supplier of technology and services. His role at the company allows him to collaborate with other talented professionals and contribute to groundbreaking projects in the field of camera systems.

Collaborations

Wallner has worked alongside notable colleagues such as Ralph Bergmann and Rene Van Gils. These collaborations have fostered an environment of creativity and innovation, leading to the development of advanced technologies.

Conclusion

Stefan Wallner's contributions to camera technology exemplify the spirit of innovation. His patents and work at Robert Bosch highlight his dedication to enhancing safety and functionality in building designs.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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