Germering, Germany

Stefan Sanner

This inventor holds 1 USPTO granted patent. Top assignee: Oxoid (Ely) Limited. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stefan Sanner. Retrieved from https://idiyas.com/inventor/stefan-sanner

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Stefan Sanner

Introduction

Stefan Sanner is a notable inventor based in Germering, Germany. He has made significant contributions to the field of sample analysis through his innovative inventions. With a focus on practical applications, Sanner's work has the potential to impact various industries.

Latest Patents

One of Sanner's key inventions is a device for taking and examining samples. This device features a tube-shaped housing that contains a cartridge, testing means, and sample-taking means. The design allows for a sample introduced by the sample-taking means to be mixed with the content of the cartridge. The testing means is then utilized to analyze the sample mixture. This invention showcases Sanner's commitment to advancing technology in sample analysis.

Career Highlights

Stefan Sanner is currently associated with Oxoid (Ely) Limited, where he continues to develop innovative solutions. His work at the company reflects his dedication to improving methods of sample examination and analysis. With a patent portfolio that includes 1 patent, Sanner has established himself as a valuable contributor to his field.

Collaborations

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Conclusion

Stefan Sanner's inventive spirit and dedication to innovation are evident in his work on sample analysis devices. His contributions are poised to make a lasting impact in the field, showcasing the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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