Hamburg, Germany

Stefan Pfleger

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Jungheinrich Aktiengesellschaft. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stefan Pfleger. Retrieved from https://idiyas.com/inventor/stefan-pfleger-cs92bd01

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Stefan Pfleger and His Patent for a Ground Conveyor Cover Panel.

Introduction

Stefan Pfleger is an inventor associated with Hamburg, Germany, and Jungheinrich Aktiengesellschaft. His listed patent concerns a cover panel for a drawbar-controlled ground conveyor.

Latest Patents

Pfleger is credited with 1 patent. The patent, titled “Cover panel for a drawbar-controlled ground conveyor on the side facing the drawbar,” describes a mainly U-shaped skirt made from a blank section. Its bar and lateral leg sections cover the conveyor’s drive unit at the side and rear and can be welded to the conveyor frame. The design also features an upper edge within the skirt’s surface and an embossed central section that projects upward to form a centering section.

Career Highlights

The available information connects Pfleger’s inventive work with Jungheinrich Aktiengesellschaft and identifies his contribution to ground-conveyor design. The patent focuses on the cover panel’s structure and positioning.

Collaborations

Markus Nagel and Andreas Knie are listed as Pfleger’s coworkers. The provided information does not specify their roles in the patent.

Conclusion

Stefan Pfleger’s listed patent documents a structural cover-panel design for a drawbar-controlled ground conveyor, associated with his work at Jungheinrich Aktiengesellschaft.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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