Hannover, Germany

Stefan Meyer

This inventor holds 1 USPTO granted patent. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stefan Meyer. Retrieved from https://idiyas.com/inventor/stefan-meyer-7yd1keaf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Stefan Meyer: Inventor of an Eye-Field Measurement Arrangement

Introduction

Stefan Meyer is an inventor associated with Hannover, Germany. His work includes a patent for an arrangement and method for measuring a field of vision, as well as the use of an implant to support objective measurement.

Latest Patents

Meyer’s listed patent is titled “Arrangement and Method for Measuring a Field of Vision and Use of an Implant.” It describes measuring eye movement during an initial measurement to assess a person’s field of vision. The proposed approach aims to make the assessment more objective, less complex, and more reliable than prior methods.

The patent also proposes using an implant containing a transponder coil, introduced into the eye, to determine intraocular pressure and support objective measurement of the boundaries of the field of vision. Meyer is associated with 1 patent.

Career Highlights

Meyer’s documented patent work focuses on ophthalmic measurement technology, combining eye-movement measurement with an implant-based approach to intraocular pressure determination.

Collaborations

The provided information identifies Max Ostermeier as Meyer’s coworker. No further details about their collaboration are available in the supplied data.

Conclusion

Stefan Meyer’s listed invention addresses objective measurement of the field of vision through eye-movement monitoring and a proposed implant-based technique.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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