Munich, Germany

Stefan Langer

This inventor holds 1 USPTO granted patent. Top assignees: Siemens Aktiengesellschaft, Siemens Corporation. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stefan Langer. Retrieved from https://idiyas.com/inventor/stefan-langer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2020

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Stefan Langer

Introduction

Stefan Langer is a notable inventor based in Munich, Germany. He has made significant contributions to the field of data processing through his innovative methods. His work primarily focuses on extracting output data sets from various input data formats.

Latest Patents

Stefan Langer holds a patent for a "Method for extracting an output data set." This invention involves several steps, including receiving an input data set that comprises both textual and visual components. The method processes the textual input using natural language processing and the visual input through image processing. Ultimately, it outputs a comprehensive data set that includes both textual and visual elements.

Career Highlights

Throughout his career, Stefan has worked with prominent companies, including Siemens Corporation and Siemens Aktiengesellschaft. His experience in these organizations has allowed him to refine his skills and contribute to various innovative projects.

Collaborations

Stefan has collaborated with talented individuals such as Volkmar Sterzing and Dmitriy Fradkin. These partnerships have further enhanced his work and led to the development of groundbreaking technologies.

Conclusion

Stefan Langer's contributions to data processing and his innovative patent demonstrate his expertise and commitment to advancing technology. His work continues to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…