Company Filing History:
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Years Active: 2013
Title: The Innovative Contributions of Stefan Kubsky
Introduction
Stefan Kubsky is a notable inventor based in Les Ulis, France. He has made significant contributions to the field of atomic force microscopy, particularly in the study and modification of surface properties. His innovative approach has led to the development of a unique device that enhances the capabilities of traditional atomic force microscopes.
Latest Patents
Stefan Kubsky holds 1 patent for his invention titled "Device and method for an atomic force microscope for the study and modification of surface properties." This invention relates to a device designed for atomic force microscopy (AFM) that allows for the study and modification of surface properties. The device features a cantilever with an integrated piezoresistive sensor, a bimorphic actuator, and a measuring tip equipped with at least two metal electrodes. The measuring tip and/or the cantilever include nanoscopic holes that enable the direction of synchrotron radiation or laser light onto the material surface being studied. The invention also encompasses a method for studying and modifying surface properties, utilizing techniques such as atomic force microscopy, surface enhanced Raman scattering, and photo emission spectroscopy.
Career Highlights
Throughout his career, Stefan Kubsky has worked with esteemed institutions, including Technische Universität Ilmenau and Synchrotron Soleil. His work has significantly advanced the understanding of surface properties and their modification, making him a valuable contributor to the field of materials science.
Collaborations
Stefan has collaborated with notable professionals in his field, including Deirdre Olynick and Peter J Schuck. These collaborations have further enriched his research and development efforts.
Conclusion
Stefan Kubsky's innovative work in atomic force microscopy exemplifies the impact of dedicated inventors in advancing scientific knowledge. His contributions continue to influence the study of surface properties and their applications in various fields.