The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2013

Filed:

Dec. 10, 2008
Applicants:

Stefan Kubsky, Les Ulis, FR;

Deirdre Olynick, El Cerrito, CA (US);

Peter Schuck, Richmond, CA (US);

Jan Meijer, Bochum, DE;

Ivo W. Rangelow, Baunatal, DE;

Inventors:

Stefan Kubsky, Les Ulis, FR;

Deirdre Olynick, El Cerrito, CA (US);

Peter Schuck, Richmond, CA (US);

Jan Meijer, Bochum, DE;

Ivo W. Rangelow, Baunatal, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/24 (2010.01);
U.S. Cl.
CPC ...
G01Q 60/24 (2013.01);
Abstract

The invention relates to a device for an atomic force microscope (AFM) for the study and/or modification of surface properties. The device comprises a cantilever (flexible bar) having an integrated, piezoresistive sensor, an integrated bimorphic actuator, and a measuring tip. The measuring tip carries at least two metal electrodes, which can be activated via electrical terminals. The measuring tip and/or the cantilever have at least one nanoscopic hole through which synchrotron radiation or laser light is directed onto the material surface to be studied. Furthermore, the invention relates to a method for the study and modification of surface properties and surface-proximal properties, which can be executed using such a device. To this end, atomic force microscopy (AFM), surface enhanced Raman scattering (SERS), photo emission spectroscopy (XPS, XAS), and material modification by local exposure are executed in sequence or simultaneously using the same device.


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