Pargas, Finland

Stefan Jarnstrom

This inventor holds 2 USPTO granted patents. Top assignee: Wallac Oy. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stefan Jarnstrom. Retrieved from https://idiyas.com/inventor/stefan-jarnstrom

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.4

ph-index = 2

Forward Citations = 26(Granted Patents)


Company Filing History:


Years Active: 1994

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2 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Stefan Jarnstrom

Introduction

Stefan Jarnstrom is a notable inventor based in Pargas, Finland. He has made significant contributions to the field of liquid scintillation counting, with a focus on preventing optical crosstalk in sample analysis. His work has led to the development of two patents that enhance the accuracy and efficiency of liquid scintillation counting processes.

Latest Patents

Stefan Jarnstrom's latest patents include a method and device for preventing optical crosstalk between liquid scintillation samples. This invention addresses the issue of optical crosstalk caused by mutual optical affection between samples deposited in a sample plate. The sample plate is designed with a plurality of sample wells, each equipped with tubes made of a material that is impermeable yet reflective or scattering for scintillation light generated by the samples.

Another significant patent is an arrangement for counting liquid scintillation samples on bottom-window multi-well sample plates. This arrangement includes sample wells with light impermeable side walls and a light permeable bottom sheet. The liquid scintillation counter is equipped with at least one photomultiplier tube and a sample plate holder that accommodates different sizes of sample plates. To prevent light passage between sample wells, a light permeable adhesive foil with black lines is attached to the bottom side of the sample plate. This innovative design allows for effective measurement of samples from both the top and bottom, enhancing the overall performance of

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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