Limburgerhof, Germany

Stefan Hahn

This inventor holds 1 USPTO granted patent. Top assignee: Basf Se Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stefan Hahn. Retrieved from https://idiyas.com/inventor/stefan-hahn-39523vyb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations by Inventor Stefan Hahn

Introduction

Stefan Hahn is an innovative inventor based in Limburgerhof, Germany. He has made significant contributions to the field of machine learning, particularly in the classification of plants infested with pathogens. His work is crucial for advancing agricultural technology and improving crop health.

Latest Patents

Stefan Hahn holds a patent for a computer-implemented method for providing training data for a machine learning algorithm. This method focuses on classifying plants that are infested with pathogens. The patent outlines a process that includes providing image data of a plant or a plant part that is infested, along with genetic result data that contains information about the type of pathogen. The image data is then labeled with the corresponding genetic result data, enhancing the accuracy of the classification process.

Career Highlights

Stefan Hahn is associated with BASF SE Corporation, a leading global company in the chemical industry. His role at BASF allows him to apply his innovative ideas in a practical setting, contributing to the development of advanced agricultural solutions.

Collaborations

Due to space constraints, the collaborations section will be omitted.

Conclusion

Stefan Hahn's work exemplifies the intersection of technology and agriculture, showcasing how innovations can lead to better management of plant health. His contributions are vital for the future of sustainable farming practices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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