Langenfeld, Germany

Stefan Gripp

This inventor holds 1 USPTO granted patent. Top assignee: Forschungszentrum Julich Gmbh. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stefan Gripp. Retrieved from https://idiyas.com/inventor/stefan-gripp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: The Innovations of Stefan Gripp

Introduction

Stefan Gripp is a notable inventor based in Langenfeld, Germany. He has made significant contributions to the field of radiation measurement technology. His work is characterized by a commitment to advancing scientific understanding and practical applications.

Latest Patents

Stefan Gripp holds a patent for a "Process and device for measuring the radiation depth of radiation." This innovation reflects his expertise in developing methods that enhance the accuracy and efficiency of radiation measurement.

Career Highlights

Stefan Gripp is currently employed at Forschungszentrum Jülich GmbH, a prominent research center in Germany. His role at this institution allows him to collaborate with leading scientists and contribute to groundbreaking research initiatives.

Collaborations

Throughout his career, Stefan has worked alongside esteemed colleagues such as Friedrich-Wolfgang Hasing and Harald Buker. These collaborations have fostered an environment of innovation and shared knowledge.

Conclusion

Stefan Gripp's contributions to the field of radiation measurement exemplify the impact of dedicated inventors in advancing technology. His work continues to influence the scientific community and improve measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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