Altenstadt, France

Stefan Blickhan

This inventor holds 1 USPTO granted patent. Top assignee: Siemens Aktiengesellschaft. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stefan Blickhan. Retrieved from https://idiyas.com/inventor/stefan-blickhan-zxbvb0fy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: The Innovations of Stefan Blickhan

Introduction

Stefan Blickhan is an accomplished inventor based in Altenstadt, France. He is known for his contributions to the field of pressure measurement technology. With a focus on innovation, he has developed a notable patent that showcases his expertise and creativity.

Latest Patents

Stefan Blickhan holds a patent for a pressure measuring device. This invention reflects his commitment to advancing technology in measurement systems. The patent demonstrates his ability to address practical challenges in the industry.

Career Highlights

Stefan is currently employed at Siemens Aktiengesellschaft, a leading global technology company. His role at Siemens allows him to work on cutting-edge projects that contribute to the company's reputation for innovation. With a strong background in engineering, he has made significant strides in his career.

Collaborations

Stefan has collaborated with talented coworkers, including Jochen Gareis and Andreas Merz. These partnerships have fostered a creative environment that encourages the exchange of ideas and expertise. Together, they work towards developing innovative solutions in their respective fields.

Conclusion

Stefan Blickhan is a prominent inventor whose work in pressure measurement technology has made a significant impact. His patent and career at Siemens highlight his dedication to innovation and collaboration. Through his efforts, he continues to contribute to advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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