Brannenburg, Germany

Stefan Binder

This inventor holds 1 USPTO granted patent and 3 published patent applications and 2 EPO patents. Top assignee: Cohu Gmbh. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stefan Binder. Retrieved from https://idiyas.com/inventor/stefan-binder-tex2yj6u

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Stefan Binder

Introduction

Stefan Binder is a notable inventor based in Brannenburg, Germany. He has made significant contributions to the field of electronic component testing. His innovative approach has led to the development of a unique automated test system.

Latest Patents

Stefan Binder holds 1 patent for an automated test system designed for testing singulated electronic components. This system includes a handler with multiple pickers, a processing station, and a test unit. The design allows for simultaneous testing and loading of electronic components, enhancing efficiency in the testing process.

Career Highlights

Throughout his career, Stefan has worked with prominent companies such as Cohu GmbH and Multitest Elektronische Systeme GmbH. His experience in these organizations has allowed him to refine his skills and contribute to advancements in electronic testing technologies.

Collaborations

Stefan has collaborated with talented individuals in his field, including Anton Schuster and Andreas Wiesböck. These partnerships have fostered innovation and the sharing of ideas, further enhancing the development of testing systems.

Conclusion

Stefan Binder's contributions to the field of electronic component testing through his innovative patent and career experiences highlight his importance as an inventor. His work continues to influence the industry and improve testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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