Oberkochen, Germany

Stefan-André Binder

This inventor holds 1 USPTO granted patent. Top assignee: Carl Zeiss Industrielle Messtechnik Gmbh. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stefan-André Binder. Retrieved from https://idiyas.com/inventor/stefan-andré-binder-wgmd9e6c

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: The Innovations of Stefan-André Binder

Introduction

Stefan-André Binder is a notable inventor based in Oberkochen, Germany. He has made significant contributions to the field of industrial measurement technology. His work is particularly recognized for its innovative approach and practical applications.

Latest Patents

Stefan-André Binder holds a patent for a "Probe Change Magazine." This invention showcases his ability to enhance efficiency and functionality in measurement systems. The patent reflects his commitment to advancing technology in his field.

Career Highlights

Stefan-André Binder is currently employed at Carl Zeiss Industrielle Messtechnik GmbH. His role at this esteemed company allows him to work on cutting-edge projects that push the boundaries of measurement technology. His expertise and innovative mindset have made him a valuable asset to the organization.

Collaborations

Stefan-André Binder collaborates with talented individuals such as Eckhard Enderle and Tobias Woletz. These partnerships foster a creative environment that encourages the development of groundbreaking ideas and solutions.

Conclusion

Stefan-André Binder's contributions to industrial measurement technology exemplify the spirit of innovation. His patent and collaborations highlight his dedication to advancing the field. His work continues to inspire future developments in measurement systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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