Santa Clara, CA, United States of America

Steen Kristensen

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Nvidia Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Steen Kristensen. Retrieved from https://idiyas.com/inventor/steen-kristensen-ubq0tchq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Steen Kristensen: Inventor in Image Stitching

Introduction

Steen Kristensen is an inventor based in Santa Clara, California, and is associated with NVIDIA Corporation. His patent work addresses image stitching for surround-view visualization.

Latest Patents

The supplied information lists one patent for Kristensen: “Image Stitching with Saccade-Based Control of Dynamic Seam Placement for Surround View Visualization.” The invention describes generating a stitched image from overlapping image frames while adjusting seam placement according to scene content and other factors. It also describes limiting how quickly seams move over time to reduce visual discontinuities. Eye tracking can detect when a viewer is experiencing a saccade or looking away from the display, allowing those movement constraints to be relaxed or lifted.

Career Highlights

Kristensen’s listed patent reflects work on combining image processing with viewer-aware display behavior. The supplied information associates him with NVIDIA Corporation and identifies 1 patent.

Collaborations

Simon Kiefhaber is identified as Kristensen’s coworker. The supplied information does not specify their particular collaboration on the patent.

Conclusion

Steen Kristensen’s listed invention focuses on making surround-view image stitching more responsive while managing seam movement to support visual continuity.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…