Haifa, Israel

Stas Shapira

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Tactile Mobility Ltd.. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stas Shapira. Retrieved from https://idiyas.com/inventor/stas-shapira

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Stas Shapira: Innovator in Tire Technology

Introduction

Stas Shapira is a notable inventor based in Haifa, Israel. He has made significant contributions to the field of vehicle technology, particularly in tire performance estimation. His innovative approach has the potential to enhance vehicle safety and efficiency.

Latest Patents

Stas Shapira holds a patent for a method titled "Estimating an effective radius of a tire of a vehicle." This method involves obtaining sensed information that reflects the distance traveled by the vehicle, the rotational speed of the tire, and various parameters affecting tire radius. The process includes selecting portions of driving sessions and determining the effective radius based on the gathered data.

Career Highlights

Stas Shapira is associated with Tactile Mobility Ltd., a company focused on advancing vehicle technology. His work there emphasizes the importance of accurate tire radius estimation, which can lead to improved vehicle dynamics and performance.

Collaborations

Stas collaborates with talented individuals such as Boaz Mizrachi and Hanan Caspi. Their combined expertise contributes to the innovative projects at Tactile Mobility Ltd.

Conclusion

Stas Shapira's contributions to tire technology exemplify the impact of innovation in the automotive industry. His patent and work at Tactile Mobility Ltd. highlight the importance of precise vehicle performance metrics.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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