Blaine, MN, United States of America

Stanley L Gruenenwald

This inventor holds 1 USPTO granted patent. Top assignee: Micro Component Technology, Inc.. Active years: 1985.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stanley L Gruenenwald. Retrieved from https://idiyas.com/inventor/stanley-l-gruenenwald-76cjdvbw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 113(Granted Patents)


Company Filing History:


Years Active: 1985

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1 patent (USPTO):Explore Patents

Title: Innovations by Stanley L. Gruenenwald

Introduction

Stanley L. Gruenenwald is a notable inventor based in Blaine, MN (US). He has made significant contributions to the field of integrated circuit testing, showcasing his expertise through his innovative patent.

Latest Patents

Stanley holds a patent for an "Integrated Circuit Test Apparatus Test Head." This invention describes an improved test system for performing DC and AC parametric and dynamic functional testing of multi-terminal integrated circuits. The design features all circuitry for producing and responding to D.C. and high-integrity stimulus and response test signals located within a Test Head module, which is compact enough for use in close proximity to the device under test. The system employs a high-integrity bus that interconnects the high-integrity producing and handling circuits, utilizing inexpensive connectors and batch-fabricated printed circuit board techniques. A Controller provides digital test commands for energizing the test signal producing circuits within the Test Head and for evaluating the test results. The control and measurement signals passing between the Controller and the Test Module do not require special conductor implementation techniques. The unique detachable, modularized bussing scheme between the Controller and Test Head, as well as within the Test Head, allows for cost-effective manufacturing while maximizing reliability, signal integrity, and manufacturing repeatability. This design enables rapid replacement and interchangeability of test circuits and functional capabilities without compromising the quality of the bus structure that carries the high integrity signals.

Career Highlights

Stanley is associated with Micro Component Technology, Inc., where he has applied his innovative ideas to advance the field of integrated circuit testing. His work has contributed to the development of more efficient testing systems that enhance the reliability of electronic devices.

Collaborations

Stanley has collaborated with notable coworkers, including Dennis M. Petrich and Christopher G. Amick, who have also contributed to advancements in technology and innovation.

Conclusion

Stanley L. Gruenenwald's contributions to integrated circuit testing through his innovative patent demonstrate his commitment to enhancing technology in the electronics industry. His work continues to influence the field and improve testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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