Endwell, NY, United States of America

Stanley J Bogumil


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: The Innovations of Stanley J. Bogumil

Introduction

Stanley J. Bogumil is a notable inventor based in Endwell, NY (US). He has made significant contributions to the field of electronics, particularly in the area of timing circuits. His innovative approach has led to the development of a patented technology that enhances the performance of electronic devices.

Latest Patents

Stanley J. Bogumil holds a patent for an "Apparatus and method for testing programmable delays." This invention focuses on the automatic generation of a timed delay for a timing clock signal input to an electronic device. The device is designed to handle time-critical circuits that receive address, data, and control signals at specific intervals. The patent outlines a method for optimizing the performance of these circuits by adjusting the timing clock signal based on data output results from previous operations. This innovation is crucial for improving the efficiency of electronic devices.

Career Highlights

Stanley J. Bogumil has had a distinguished career at International Business Machines Corporation (IBM). His work has been instrumental in advancing the technology used in electronic devices. With a focus on timing circuits, he has contributed to various projects that enhance the functionality and reliability of electronic systems.

Collaborations

Throughout his career, Stanley has collaborated with notable colleagues, including Charles E. Boice and Frederic G. Webster. These partnerships have fostered an environment of innovation and have led to the successful development of various technologies.

Conclusion

Stanley J. Bogumil's contributions to the field of electronics, particularly through his patented technology, have had a lasting impact on the industry. His work continues to influence the design and performance of electronic devices today.

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