Samara, Russia

Stanislav Mednikov

This inventor holds 1 USPTO granted patent. Top assignee: Micro-Epsilon Messtechnik Gmbh & Co. Kg. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stanislav Mednikov. Retrieved from https://idiyas.com/inventor/stanislav-mednikov

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: The Innovations of Stanislav Mednikov

Introduction

Stanislav Mednikov is a notable inventor based in Samara, Russia. He has made significant contributions to the field of technology, particularly in the development of devices that enhance object detection.

Latest Patents

Mednikov holds a patent for a "Device and method for detecting the position of an object." This innovative device is designed to detect the position of an object, such as the armature of an inlet or outlet valve. The device comprises at least two coils, preferably two magnet coils, which can be energized to move the object between the coils or used with an evaluation circuit for detecting the object's position. The two coils are alternately utilized for moving the object and for detecting its position.

Career Highlights

Stanislav Mednikov is currently employed at Micro-Epsilon Messtechnik GmbH & Co. KG, a company known for its precision measurement technology. His work there focuses on advancing detection methods and improving the functionality of various devices.

Collaborations

Some of his notable coworkers include Felix Mednikov and Mark Netschaewsky, who contribute to the innovative environment at Micro-Epsilon Messtechnik.

Conclusion

Stanislav Mednikov's work in developing detection devices showcases his commitment to innovation and technology. His contributions are valuable to the field and highlight the importance of advancements in object detection methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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