Srujan Kumar Nakidi

Title: Srujan Kumar Nakidi: Innovator in Integrated Circuit Testing

Introduction

Srujan Kumar Nakidi is a notable inventor based in Adilabad, India. He has made significant contributions to the field of integrated circuit testing, particularly through his innovative patent. His work focuses on enhancing the efficiency and effectiveness of scan tests in integrated circuits.

Latest Patents

Srujan Kumar Nakidi holds a patent titled "Enhanced control in scan tests of integrated circuits with partitioned scan chains." This invention introduces a test controller implemented in an integrated circuit that utilizes partitioned scan chains to provide enhanced control during scan tests. The test controller can selectively manage the scan-in, scan-out, and capture phases of scan tests for different scan chains independently. Notably, the number of pins required to interface the test controller with an external tester is less than the number of partitions it can support. Additionally, the integrated circuit includes a register for each partition to facilitate transition fault testing. The design also incorporates serial to parallel and parallel to serial converters, minimizing the external pins needed for scan tests.

Career Highlights

Srujan Kumar Nakidi is currently employed at Texas Instruments Corporation, where he continues to contribute to advancements in integrated circuit technology. His work has been instrumental in improving testing methodologies, which are crucial for ensuring the reliability of electronic devices.

Collaborations

Some of his notable coworkers include Alan David Hales and Rubin Ajit Parekhji, who have collaborated with him on various projects within the field of integrated circuits.

Conclusion

Srujan Kumar Nakidi's innovative approach to integrated circuit testing has led to significant advancements in the industry. His patent demonstrates a commitment to enhancing the efficiency of scan tests, which is vital for the development of reliable electronic systems.