The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2012
Filed:
Oct. 23, 2009
Alan David Hales, Richardson, TX (US);
Srujan Kumar Nakidi, Adilabad, IN;
Rubin Ajit Parekhji, Bangalore, IN;
Srivaths Ravi, Bangalore, IN;
Rajesh Kumar Tiwari, Lucknow, IN;
Alan David Hales, Richardson, TX (US);
Srujan Kumar Nakidi, Adilabad, IN;
Rubin Ajit Parekhji, Bangalore, IN;
Srivaths Ravi, Bangalore, IN;
Rajesh Kumar Tiwari, Lucknow, IN;
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A test controller implemented in an integrated circuit (IC) with partitioned scan chains provides enhanced control in performing scan tests. According to an aspect, a test controller can selectively control scan-in, scan-out and capture phases of scan tests for different scan chains of the IC to be independent. The number of pins required to interface the test controller with an external tester is less than the number of partitions that the test controller can support. According to another aspect, an IC includes a register corresponding to each partition to support transition fault (or LOS) testing. According to another aspect, an IC with partitioned scan chains includes serial to parallel and parallel to serial converters, thereby minimizing the external pins required to support scan tests.