Hyderabad, India

Srinivas Mulkala

This inventor holds 1 USPTO granted patent. Top assignee: Carrier Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Srinivas Mulkala. Retrieved from https://idiyas.com/inventor/srinivas-mulkala

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Srinivas Mulkala: Inventor of an Airborne Contaminant Detection System.

Introduction

Srinivas Mulkala is an inventor based in Hyderabad, India, associated with Carrier Corporation. His work includes a patent for detecting and locating airborne contaminants in ducting systems.

Latest Patents

Mulkala is credited with 1 patent: “Airborne Contaminant Detection and Localization in Ducting Systems.” The invention describes an HVAC duct with vents serving separate indoor spaces and sensor elements positioned near those vents. A central unit uses sensor data and the sensors’ locations to determine the presence and intensity of contaminants, then identifies a detection zone around the vent where the highest intensity is detected.

Career Highlights

The patent reflects Mulkala’s work on monitoring air quality within HVAC duct networks. Its approach combines distributed sensors with centralized analysis to help identify where airborne contaminants are detected.

Collaborations

Mulkala’s listed coworkers include Lasya A and Ganapuram Ranjith Kumar. The patent’s described system also involves coordinated sensor elements and a central unit, though the available information does not specify the coworkers’ roles in the invention.

Conclusion

Srinivas Mulkala’s patent focuses on detecting and localizing airborne contaminants in HVAC ducting, connecting sensor measurements with their locations to identify areas of elevated contaminant intensity.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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